EE 182: Analog and Mixed-Signal IC Test Development
San Jose State University
Introduction to analog and mixed-signal IC and component measurements and automated testing. Test specifications, methods, techniques, and interfaces. Measurement accuracy, correction, and calibration. Automated test equipment (ATE) hardware and software. DAC/ADC testing and DSP-based testing. Analog and mixed-signal design for test (DFT). Laboratory exercises and mini projects. Prerequisite(s): EE 112, EE 118, and EE 122 all with grades of "C-" or better. Corequisite(s): EE 102 can be taken concurrently.
Average GPA: 2.95
Grade distribution records: 226 students across 10 terms.
Grade distribution
| Grade | Students | Percent |
|---|---|---|
| A | 41 | 18.1% |
| A- | 16 | 7.1% |
| B+ | 23 | 10.2% |
| B | 66 | 29.2% |
| B- | 20 | 8.8% |
| C+ | 21 | 9.3% |
| C | 29 | 12.8% |
| C- | 4 | 1.8% |
| D | 1 | 0.4% |
| D- | 1 | 0.4% |
| F | 4 | 1.8% |
Based on 226 student grade records across 10 terms and 1 professor.
Instructors
- Jeonghee Kim 226 students, Average GPA 2.95